Title :
Assessing Reliability by Multidimensional Convolution with Quantization
Author :
Becker, Peter W. ; Jarkler, Björn
Author_Institution :
Electronics Laboratory, Technical University of Denmark, Bldg. 344, 2800 Lyngby, Denmark
Abstract :
Consider a system with several input parameters; each input is a stochastic variable. The joint probability of all system outputs simultaneously meeting their specifications is found by a hitherto unpublished method called ``Multi-dimensional Convolution with Quantization.´´ To use the method, two assumptions must be satisfied; the assumptions are milder than the two popular assumptions of linearity and statistical independence. There is one example.
Keywords :
Acquired immune deficiency syndrome; Associate members; Convolution; Input variables; Linearity; Multidimensional systems; Probability; Production systems; Quantization; Stochastic processes;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215247