• DocumentCode
    1317053
  • Title

    Methods for Calculating the Reliability Function for Systems Subjected to Random Stresses

  • Author

    Tumolillo, Thomas A.

  • Author_Institution
    Intelcom Rad Tech, 7650 Convoy Court, San Diego, Calif. 92138
  • Issue
    4
  • fYear
    1974
  • Firstpage
    256
  • Lastpage
    262
  • Abstract
    The reliability function is calculated for components and systems which are subjected to stresses arriving randomly in time at a given average rate. The component is assumed to exist in a finite number of states, each of which is affected differently by the applied stress. During normal operation, failure rates are assigned to each of the states of the component; when the stress is applied, the failure rates for each state change to a new value. By defining the transitions among the states as a first order Markov process, the average probability of no failure prior to and including time t is calculated for the cases where the sets of failure rates are either discrete or continuous. The solution for the average probability is given as a matrix equation and several methods for reducing the equation to a useable form are examined. In addition, the theory of failure and repair processes is reviewed and methods for simplifying the calculation of the reliability of a system are presented.
  • Keywords
    Acquired immune deficiency syndrome; Differential equations; Markov processes; Matrices; Probability; Reliability engineering; Reliability theory; Stress; Surges; Voltage;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1974.5215267
  • Filename
    5215267