Title :
Methods for Calculating the Reliability Function for Systems Subjected to Random Stresses
Author :
Tumolillo, Thomas A.
Author_Institution :
Intelcom Rad Tech, 7650 Convoy Court, San Diego, Calif. 92138
Abstract :
The reliability function is calculated for components and systems which are subjected to stresses arriving randomly in time at a given average rate. The component is assumed to exist in a finite number of states, each of which is affected differently by the applied stress. During normal operation, failure rates are assigned to each of the states of the component; when the stress is applied, the failure rates for each state change to a new value. By defining the transitions among the states as a first order Markov process, the average probability of no failure prior to and including time t is calculated for the cases where the sets of failure rates are either discrete or continuous. The solution for the average probability is given as a matrix equation and several methods for reducing the equation to a useable form are examined. In addition, the theory of failure and repair processes is reviewed and methods for simplifying the calculation of the reliability of a system are presented.
Keywords :
Acquired immune deficiency syndrome; Differential equations; Markov processes; Matrices; Probability; Reliability engineering; Reliability theory; Stress; Surges; Voltage;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215267