Title :
Proposal for a versatile monolithic multi-Gbit/s m-sequence test system
Author :
Bussmann, Michael ; Langmann, U.
Author_Institution :
Ruhr-Univ. Bochum, Mikroelektronik-Zentrum, West Germany
Abstract :
A multi-functional system is proposed which combines four important features for m-sequence applications: generation of m-sequences, detection of bit errors, derivation of word synchronisation pulses, and scrambling as well as descrambling of a data stream. Circuit simulations show that a monolithic realisation for data rates of more than 10 Gbit/s is feasible using a simple self-aligning Si bipolar technology.
Keywords :
binary sequences; bipolar integrated circuits; digital integrated circuits; elemental semiconductors; emitter-coupled logic; shift registers; silicon; test equipment; 10 Gbit/s; Si circuits; derivation of word synchronisation pulses; descrambling; detection of bit errors; features; m-sequence generation; maximum length sequence generator; monolithic realisation; multi-Gbit/s m-sequence test system; multi-functional system; pseudorandom binary sequence generator; scrambling; semiconductors; simple self-aligning Si bipolar technology;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19901041
