DocumentCode
1317169
Title
Approximately Optimum Confidence Bounds on Series- and Parallel-system Reliability for Systems with Binomial Subsystem Data
Author
Mann, Nancy R.
Author_Institution
1049 Camino Dos Rios, Thousand Oaks, Calif. 91360 USA
Issue
5
fYear
1974
Firstpage
295
Lastpage
304
Abstract
A method is derived for obtaining either randomized or nonrandomized lower confidence bounds on the reliability of independent series or parallel systems when subsystem data are binomially distributed. Both types of confidence bounds agree with published values of optimum confidence bounds to within about a unit in the second significant figure. In using the method derived for obtaining nonrandomized confidence bounds there is no difficulty with the number of subsystems in the system or of a requirement of equal sample sizes, as with the standard method of obtaining the optimum bounds. Existence of subsystems for which no failures are observed also presents no difficulty, in contrast to the maximum-likelihood and likelihood-ratio approximations. Numerical comparisons are made between optimum confidence bounds and those based on other approximating methods.
Keywords
Acquired immune deficiency syndrome; Gaussian distribution; Life testing; Mathematics; Prototypes; Reliability engineering; Statistics; System testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1974.5215290
Filename
5215290
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