• DocumentCode
    1317229
  • Title

    Design and Analysis of a W-Band SiGe Direct-Detection-Based Passive Imaging Receiver

  • Author

    Gilreath, L. ; Jain, Vinesh ; Heydari, Payam

  • Author_Institution
    Adv. Technol. Dept., Northrop Grumman Aerosp. Syst., Redondo Beach, CA, USA
  • Volume
    46
  • Issue
    10
  • fYear
    2011
  • Firstpage
    2240
  • Lastpage
    2252
  • Abstract
    A W-band direct-detection-based receiver front-end for millimeter-wave passive imaging in a 0.18-μm BiCMOS process is presented. The proposed system is comprised of a direct-detection front-end architecture employing a balanced LNA with an embedded Dicke switch, power detector, and baseband circuitry. The use of a balanced LNA with an embedded Dicke switch minimizes front-end noise figure, resulting in a great imaging resolution. The receiver chip achieves a measured responsivity of 20-43 MV/W with a front-end 3-dB bandwidth of 26 GHz, while consuming 200 mW. The calculated NETD of the SiGe receiver chip is 0.4 K with a 30 ms integration time. This work demonstrates the possibility of silicon-based system-on-chip solutions as lower cost alternatives to compound semiconductor multi-chip imaging modules.
  • Keywords
    BiCMOS analogue integrated circuits; Ge-Si alloys; field effect MIMIC; low noise amplifiers; microwave amplifiers; microwave imaging; microwave receivers; system-on-chip; BiCMOS process; LNA; NETD; SiGe; W-band direct-detection; baseband circuitry; direct-detection front-end architecture; embedded Dicke switch; frequency 26 GHz; front-end noise figure; gain 3 dB; millimeter-wave passive imaging; passive imaging receiver; power 200 mW; power detector; semiconductor multichip imaging modules; silicon-based system-on-chip solutions; size 0.18 mum; time 30 ms; Gain; Imaging; Insertion loss; Noise; Noise measurement; Silicon germanium; Switches; Dicke switch; direct detection; low noise amplifier (LNA); passive imaging; power detector; radiometer; silicon- germanium;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2011.2162792
  • Filename
    6015499