Title :
Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation
Author :
Bolchini, Cristiana ; Sandionigi, Chiara
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology to enable the exploitation of these devices also in space applications, typically characterized by long mission times, where permanent faults become an issue. By starting from a characterization of the radiation effects and aging mechanisms, we define a controller able to classify such faults and consequently to apply the appropriate mitigation strategy.
Keywords :
SRAM chips; ageing; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; radiation effects; space vehicle electronics; SRAM-based FPGA; aging mechanism; classification algorithm; controller; fault classification; fault mitigation strategy; fault tolerant systems; field-programmable gate arrays; radiation effects; recoverable faults; space environment; static random access memory; Circuit faults; Classification algorithms; Fault tolerant systems; Field programmable gate arrays; Performance evaluation; Space missions; Fault tolerant systems; field-programmable gate arrays (FPGA);
Journal_Title :
Embedded Systems Letters, IEEE
DOI :
10.1109/LES.2010.2073441