• DocumentCode
    1317424
  • Title

    Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation

  • Author

    Bolchini, Cristiana ; Sandionigi, Chiara

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • Volume
    2
  • Issue
    4
  • fYear
    2010
  • Firstpage
    107
  • Lastpage
    110
  • Abstract
    This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology to enable the exploitation of these devices also in space applications, typically characterized by long mission times, where permanent faults become an issue. By starting from a characterization of the radiation effects and aging mechanisms, we define a controller able to classify such faults and consequently to apply the appropriate mitigation strategy.
  • Keywords
    SRAM chips; ageing; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; radiation effects; space vehicle electronics; SRAM-based FPGA; aging mechanism; classification algorithm; controller; fault classification; fault mitigation strategy; fault tolerant systems; field-programmable gate arrays; radiation effects; recoverable faults; space environment; static random access memory; Circuit faults; Classification algorithms; Fault tolerant systems; Field programmable gate arrays; Performance evaluation; Space missions; Fault tolerant systems; field-programmable gate arrays (FPGA);
  • fLanguage
    English
  • Journal_Title
    Embedded Systems Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0663
  • Type

    jour

  • DOI
    10.1109/LES.2010.2073441
  • Filename
    5567132