DocumentCode :
1317475
Title :
Layout-driven chaining of scan flip-flops
Author :
Lin, K.-H. ; Chen, C.-S. ; Hwang, T.T.
Author_Institution :
Dept. of Comput. Sci., Tsing Hua Univ., Hsin-Chu, Taiwan
Volume :
143
Issue :
6
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
421
Lastpage :
425
Abstract :
In an era of submicron technology, routing is becoming a dominant factor in area, timing and power consumption. The problem of scan flip-flops chaining with the objective of achieving minimum routing area overhead is studied. The first attempt is to chain the flip-flops at the logic level. To make more accurate decisions on chaining flip-flops, the second attempt is to perform the chaining of scan flip-flops taking layout information into consideration. Specifically, the authors show that the chaining problem is a travelling salesman problem (TSP). Then, two heuristics, greedy and matching-based algorithms, are proposed to solve the TSP problem. Various cost functions are defined which take layout information into account. Benchmarking results show that the cost function achieves the best results when it considers placement and routing information and is dynamically updated
Keywords :
circuit layout CAD; circuit optimisation; flip-flops; logic CAD; network routing; travelling salesman problems; benchmarking results; cost functions; greedy algorithm; heuristics; layout information; layout-driven chaining; matching-based algorithm; minimum routing area overhead; power consumption; scan flip-flops; submicron technology; timing; travelling salesman problem;
fLanguage :
English
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2387
Type :
jour
DOI :
10.1049/ip-cdt:19960638
Filename :
556714
Link To Document :
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