Title :
Selection of a thresholding scheme for on-line quality inspection
Author :
Rajendran, N. ; Sid-Ahmed, M.A.
Author_Institution :
Dept. of Electrical Engng., Univ. of Windsor, Windsor, Ont., Canada
Abstract :
Thresholding of a given image into a binary one is a necessary step for most image analysis techniques. Different thresholding techniques have been proposed in the literature to achieve this goal. In this work the authors investigate some of the available techniques, and examine their suitability for industrial applications, such as on-line quality inspection. Single and multi-level thresholding schemes are applied to images of industrial parts and the results are presented. In addition, examples are given to show how the defects can be detected using image processing techniques.
Keywords :
inspection; picture processing; quality control; image analysis techniques; image processing techniques; industrial parts; online quality inspection; thresholding scheme; Fitting; Gears; Head; Histograms; Image edge detection; Sociology;
Journal_Title :
Electrical Engineering Journal, Canadian
DOI :
10.1109/CEEJ.1983.6591840