DocumentCode
1318471
Title
Minimization of uncertainties in analog measurements for use in state estimation
Author
Adibi, M.M. ; Kafka, R.J.
Author_Institution
IRD Corp., Bethesda, MD, USA
Volume
5
Issue
3
fYear
1990
fDate
8/1/1990 12:00:00 AM
Firstpage
902
Lastpage
910
Abstract
It is pointed out that the uncertainty in an analog measurement is a combination of systematic error and random error; The systematic error completely dominates the random error and varies in a recognizable pattern over the range of measurement. A procedure is presented for reducing the systematic errors and estimating the prevailing standard deviations. A range of analog measurements is obtained from a transmission station, spanning peak and light-load conditions. Then the redundancies in measurements are used to formulate several functions relating these measurements with their attending errors. Minimization of these functions yields the required correction coefficients which are used to minimize the systematic errors and to evaluate the actual random errors, both of which are required by the state estimation. The approach developed uses voltage, real, and reactive power measurements which generally are available and used by state estimators. Current measurement is limited to a critical line or transformer per substation. The effectiveness of the proposed approach is confirmed by an experiment involving a 500/230 kV transmission station
Keywords
power measurement; power system measurement; state estimation; voltage measurement; 230 kV; 500 kV; analog measurements; light-load conditions; random error; reactive power measurements; real power measurement; spanning peak; state estimation; systematic error; transmission station; uncertainties; voltage measurements; Calibration; Control systems; Current measurement; Instruments; Measurement uncertainty; Power measurement; Power system measurements; Reactive power; State estimation; Voltage;
fLanguage
English
Journal_Title
Power Systems, IEEE Transactions on
Publisher
ieee
ISSN
0885-8950
Type
jour
DOI
10.1109/59.65920
Filename
65920
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