DocumentCode :
1318635
Title :
Refractive index of AlGaInN alloys
Author :
Peng, T. ; Piprek, J.
Author_Institution :
Mater. Sci. Program, Delaware Univ., Newark, DE, USA
Volume :
32
Issue :
24
fYear :
1996
fDate :
11/21/1996 12:00:00 AM
Firstpage :
2285
Lastpage :
2286
Abstract :
The refractive index of quaternary nitride alloys is calculated for the transparent ultraviolet to green wavelength range (370-565 nm) by nonlinear interpolation of binary alloy parameters measured. Results given as function of composition for different substrates show strong deviations from linear interpolations
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; refractive index; 370 to 565 nm; AlGaInN; quaternary nitride alloys; refractive index; semiconductor; substrate compositions;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19961546
Filename :
556819
Link To Document :
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