• DocumentCode
    1318939
  • Title

    Single event upset at ground level

  • Author

    Normand, Eugene

  • Author_Institution
    Boeing Defense & Space Group, Seattle, WA, USA
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2742
  • Lastpage
    2750
  • Abstract
    Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam
  • Keywords
    DRAM chips; integrated circuit reliability; integrated circuit testing; neutron effects; DRAM chips; Weapons Neutron Research; atmospheric neutrons; computer systems; ground level; neutron beam; random access memory; single event upset; Aerospace electronics; Alpha particles; Biomedical measurements; Computer errors; Neutrons; Packaging; Particle beams; Random access memory; Read-write memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556861
  • Filename
    556861
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1318939