DocumentCode :
1319031
Title :
TRECO: Dynamic Technology Remapping for Timing Engineering Change Orders
Author :
Ho, Kuan-Hsien ; Jiang, Jie-Hong Roland ; Chang, Yao-Wen
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
31
Issue :
11
fYear :
2012
Firstpage :
1723
Lastpage :
1733
Abstract :
Due to increasing integrated circuit design complexity, engineering change orders (ECOs) have become a necessary technique to resolve late-found functional errors and/or performance deficiencies. To fix timing violations, gate sizing and buffer insertion are commonly used in postmask ECO. These techniques, however, may not be powerful enough, especially when spare cells are inserted to balance between functional and timing repair capabilities. We propose a postmask ECO technique, called TRECO, to remedy timing violations based on technology remapping, which also supports functional ECO. Unlike conventional technology mapping, TRECO performs technology mapping with respect to a limited set of spare cells and confronts dynamic changes of wiring cost incurred by selection of different spare cells. With a precomputed lookup table of representative circuit templates, TRECO iteratively performs technology remapping to restructure timing critical subcircuits until no timing violation can be further removed. Experimental results on five industrial designs show the effectiveness of TRECO in ECO timing optimization and in timing-aware functional ECO.
Keywords :
buffer circuits; circuit complexity; circuit optimisation; integrated circuit design; integrated logic circuits; logic design; ECO timing optimization; TRECO; buffer insertion; dynamic technology remapping; gate sizing; integrated circuit design complexity; postmask ECO technique; spare cells; timing critical subcircuits; timing engineering change orders; timing repair capability; timing-aware functional ECO; Inverters; Libraries; Logic gates; Maintenance engineering; Optimization; Timing; Wires; Buffer insertion; engineering change order (ECO); gate sizing; technology mapping; timing optimization;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2201480
Filename :
6331643
Link To Document :
بازگشت