• DocumentCode
    1319038
  • Title

    An empirical model for predicting proton induced upset

  • Author

    Calvel, Philippe ; Barillot, Catherine ; Lamothe, Pierre ; Ecoffet, Robert ; Duzellier, Sophie ; Falguere, Didier

  • Author_Institution
    Alcatel Espace, Toulouse, France
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2827
  • Lastpage
    2832
  • Abstract
    This paper presents an empirical model for proton induced Single Event Upset (SEU). This model is based on heavy ion data, and will improve the previous `two parameters´ Bendel model. Application to various parts is presented
  • Keywords
    integrated circuit modelling; proton effects; empirical PROFIT model; heavy ion data; proton induced SEU; single event upset; two parameter Bendel model; Electron traps; Equations; Mathematical model; Orbital calculations; Predictive models; Protons; Read-write memory; Single event upset; Surface fitting; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.556873
  • Filename
    556873
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1319038