DocumentCode :
1319067
Title :
Pad Assignment for Die-Stacking System-in-Package Design
Author :
Mak, Wai-Kei ; Lin, Yu-Chen ; Chu, Chris ; Wang, Ting-Chi
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
31
Issue :
11
fYear :
2012
Firstpage :
1711
Lastpage :
1722
Abstract :
Wire bonding is currently the most popular method for connecting signals between dies in system-in-package (SiP) design. Pad assignment, which assigns inter-die signals to die pads so as to facilitate wire bonding, is an important physical design problem for SiP design because the quality of a pad assignment solution affects both the cost and the performance of an SiP design. In this paper, we study a pad assignment problem, which prohibits the generation of illegal crossings and aims to minimize the total signal wirelength, for die-stacking SiP design. We first consider the two-die cases and die-stacks with a bridging die, and present a minimum-cost flow-based approach to optimally solve them in polynomial time. We then describe an approach, which uses a modified left-edge algorithm and an integer linear programming technique, for pyramid die-stacks with no bridging die. Finally, we discuss extensions of the two approaches to handle additional design constraints. Encouraging experimental results are shown to support our approaches.
Keywords :
integer programming; integrated circuit design; lead bonding; linear programming; polynomials; system-in-package; bridging die; die pads; die-stacking SiP design; die-stacking system-in-package design; integer linear programming technique; inter-die signals; left-edge algorithm; minimum-cost flow-based approach; pad assignment; polynomial time; pyramid die-stacks; two-die cases; wire bonding; Algorithm design and analysis; Bonding; Indexes; Polynomials; Routing; Substrates; Wires; Die-stack; pad assignment; system-in-package; wire bonding;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2202395
Filename :
6331649
Link To Document :
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