DocumentCode :
1319089
Title :
Efficient Thermal Simulation for 3-D IC With Thermal Through-Silicon Vias
Author :
Oh, Dongkeun ; Chen, Charlie Chung Ping ; Hu, Yu Hen
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
Volume :
31
Issue :
11
fYear :
2012
Firstpage :
1767
Lastpage :
1771
Abstract :
A novel virtual power source (VPS) method is proposed that can significantly speedup 3-D integrated circuit (IC) thermal simulation with sparely deployed thermal TSVs leveraging Green function-based analytical spectral method. Specifically, it is shown that the impact of TSVs with nonhomogeneous thermal conductivity on thermal simulation may be modeled as VPSs located at mesh grids inside the thermal TSVs. Using this VPS model, the temperature distribution over the entire 3-D IC may be obtained by solving for the thermal distribution of a thermally homogeneous substrate in the presence of these VPSs. As such, the fast spectral method may be applied to accelerate the simulation. Significant (3-100 times) speedup over a baseline finite difference method implementation has been observed in preliminary simulations.
Keywords :
Green´s function methods; finite difference methods; spectral analysis; temperature distribution; thermal conductivity; three-dimensional integrated circuits; 3D IC thermal simulation; Green function-based analytical spectral method; TSV; VPS method; baseline finite difference method; mesh grids; nonhomogeneous thermal conductivity; spectral method; speedup 3D integrated circuit thermal simulation; temperature distribution; thermal through-silicon vias; thermally homogeneous substrate; virtual power source method; Computational modeling; Conductivity; Integrated circuit modeling; Thermal analysis; Thermal conductivity; Through-silicon vias; Analytical method; Green function; thermal simulation; through-silicon via; virtual power source;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2196435
Filename :
6331652
Link To Document :
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