• DocumentCode
    1319141
  • Title

    Interelectrode capacitance nonlinearities in vertical power DMOSFETs

  • Author

    Shenai, Krishna

  • Author_Institution
    Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1991
  • Firstpage
    280
  • Lastpage
    282
  • Abstract
    Extensive numerical simulations were performed to understand interelectrode capacitance characteristics of vertical power DMOSFETs. Two-dimensional simulations indicate large capacitance-voltage nonlinearities, especially for the gate-to-drain Miller capacitance Cgd. Capacitance-voltage characteristics are explained in terms of a simple equivalent circuit that relates each capacitance component to its physical origin.
  • Keywords
    capacitance; equivalent circuits; insulated gate field effect transistors; power transistors; semiconductor device models; capacitance-voltage nonlinearities; equivalent circuit; gate-to-drain Miller capacitance; interelectrode capacitance characteristics; numerical simulations; vertical power DMOSFETs;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910178
  • Filename
    83256