A systems-oriented single event effects test approach for high speed digital phase-locked loops

Author

Jobe, K. ; Shoga, M. ; Koga, R.

Author_Institution

Hughes Space & Commun., Los Angeles, CA, USA

Volume

43

Issue

6

fYear

1996

fDate

12/1/1996 12:00:00 AM

Firstpage

2868

Lastpage

2873

Abstract

A systems-oriented single event effects (SEE) test approach is outlined here for two different phase-locked loop (PLL) application specific integrated circuits (ASICs) used for spaceborne local oscillator (LO) generation. The system considerations in designing the upset detection technique is described. This is the only known technique for getting information critical to the system about single event upset (SEU) sensitivity at speed for PLLs. Test results are presented for PLL devices operating at clock speeds of 1.0 and 1.5 GHz. Significant frequency effects were not observed in these devices since the clock speed varied only 50%

Keywords

application specific integrated circuits; digital phase locked loops; integrated circuit testing; 1.0 GHz; 1.5 GHz; SEU; application specific integrated circuit; high speed digital phase-locked loop; spaceborne local oscillator; systems-oriented single event effects test; upset detection; Aerospace testing; Circuit testing; Clocks; Frequency; Logic devices; Logic testing; Phase detection; Phase locked loops; Single event upset; System testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.556879

Filename

556879