Title :
Heavy ion and proton induced single event transients in comparators
Author :
Nichols, Donald K. ; Coss, James R. ; Miyahira, Tetsuo F. ; Schwartz, Harvey R.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.)
Keywords :
analogue integrated circuits; comparators (circuits); ion beam effects; proton effects; transient response; comparators; extended pulse duration; heavy ion induced transients; high voltage amplitude; linear ICs; low LET threshold; proton induced transients; single event transients; Capacitors; Circuit testing; Cyclotrons; Displays; Laboratories; Propulsion; Protons; Satellites; Threshold voltage; Transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
