DocumentCode
1319275
Title
Single event effects in pulse width modulation controllers
Author
Penzin, S.H. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Kirshman, J.F. ; Koga, R.
Author_Institution
Aerosp. Corp., El Segundo, CA, USA
Volume
43
Issue
6
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
2968
Lastpage
2973
Abstract
SEE testing was performed on pulse width modulation (PWM) controllers which are commonly used in switching mode power supply systems. The devices are designed using both Set-Reset (SR) flip-flops and Toggle (T) flip-flops which are vulnerable to single event upset (SEU) in a radiation environment. Depending on the implementation of the different devices the effect can be significant in spaceflight hardware
Keywords
controllers; flip-flops; ion beam effects; power system control; pulse width modulation; switched mode power supplies; SEE testing; pulse width modulation controller; radiation environment; set-reset flip-flop; single event upset; spaceflight hardware; switching mode power supply; toggle flip-flop; Control systems; Flip-flops; Hardware; Performance evaluation; Pulse width modulation; Pulsed power supplies; Single event upset; Space vector pulse width modulation; Strontium; System testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.556893
Filename
556893
Link To Document