Title :
A Comparison of Methods for Analyzing Censored Life Data to Estimate Relationships Between Stress and Product Life
Author :
Hahn, Gerald J. ; Nelson, Wayne
Author_Institution :
Corporate Research and Development Center, General Electric Company, Schenectady, N. Y. 12345.
fDate :
4/1/1974 12:00:00 AM
Abstract :
This article briefly reviews graphical, maximum likelihood, and linear estimation methods for analyzing censored life data to estimate relationships between stress and product life. Each method is illustrated by an example dealing with accelerated life test data on motor insulation. The advantages and disadvantages of the methods are compared to guide the choice of a method for a given application.
Keywords :
Acceleration; Data analysis; Failure analysis; Insulation testing; Life estimation; Life testing; Maximum likelihood estimation; Statistics; Stress; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1974.5215696
