Title :
The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space
Author :
Koga, R. ; Crawford, K.B. ; Hansel, S.J. ; Crain, W.R. ; Penzin, S.H. ; Miller, S.W.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
Digital signal processors (DSPs) sensitive to SEE may be utilized in some space-borne systems, in which the effects of cosmic-rays and trapped protons are limited. Thorough ground testing for SEE is essential in designing an SEE tolerant system, with a minimized risk factor
Keywords :
computer testing; cosmic ray interactions; digital signal processing chips; integrated circuit reliability; integrated circuit testing; proton effects; space vehicle electronics; COTS digital signal processor chips; SEE sensitivity; cosmic-rays; ground testing; risk factor; single event effects; space-borne systems; trapped protons; Circuit testing; Clocks; Digital signal processing; Digital signal processors; Logic devices; Random access memory; Read only memory; Read-write memory; Registers; Synchronization;
Journal_Title :
Nuclear Science, IEEE Transactions on
