Title :
Mechanism of anomalous degradation of silicon solar cells subjected to high-fluence irradiation
Author :
Ohshima, Takeshi ; Morita, Yousuke ; Nashiyama, Isamu ; Kawasaki, Osamu ; Hisamatsu, Tadashi ; Nakao, Tetsuya ; Wakow, Yoshihito ; Matsuda, Sumio
Author_Institution :
JAERI, Gunma, Japan
fDate :
12/1/1996 12:00:00 AM
Abstract :
We have found anomalous degradation of electrical performance in silicon solar cells designed for space use due to high-fluence irradiation of charged particles, e.g., 1 MeV-electrons of ~1017 e/cm2 and 10 MeV-protons of ~1014 p/cm2. This anomalous degradation has two typical features, i.e., sudden-drop-down of electrical performances and slight recovery of the short circuit current ISC just before the sudden-drop-down, which cannot be explained by a conventional model based on decrease of the minority-carrier life-time. In order to account for these features, we propose a new model, in which decreases of the majority-carrier concentration and the minority-carrier mobility are considered in addition to that of the minority-carrier life-time. The anomalous degradation observed is well represented by this model
Keywords :
aerospace testing; carrier lifetime; carrier mobility; electric properties; electron beam effects; proton effects; semiconductor device models; semiconductor device reliability; semiconductor device testing; silicon; solar cells; 1 MeV; 10 MeV; MeV-electrons; MeV-protons; Si; anomalous degradation; charged particles; electrical performance; high-fluence irradiation; majority-carrier concentration; minority-carrier life-time; minority-carrier mobility; short circuit current; silicon solar cells; space use; sudden-drop-down; Degradation; Electrons; Gallium arsenide; Photovoltaic cells; Power supplies; Protons; Satellites; Short circuit currents; Silicon; Space charge;
Journal_Title :
Nuclear Science, IEEE Transactions on