Title :
Comparison of laser diode response to pulsed electrical and radiative excitations
Author :
Baggio, J. ; Rainsant, J.M. ; D´hose, C. ; Lalande, P. ; Musseau, O. ; Leray, J.L.
Author_Institution :
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
fDate :
12/1/1996 12:00:00 AM
Abstract :
We have studied the electrical and optical response of two laser diodes under transient irradiation. Both diodes exhibit a positive photocurrent, which adds to the bias current, and a decrease of the optical power until extinction when dose rate is increased. Direct carrier generation in the laser cavity is a second order phenomena. The diode overall response is driven by both the substrate photocurrent and the transient conduction of current confinement regions, which decrease the net current density in the cavity and switches-off the laser emission. This behaviour is in good agreement with pulsed electrical characterizations and 2D simulations
Keywords :
Fabry-Perot resonators; current density; distributed feedback lasers; laser cavity resonators; laser variables measurement; optical testing; photoconductivity; semiconductor device models; semiconductor device testing; semiconductor lasers; 2D simulations; bias current; current confinement regions; diode overall response; direct carrier generation; distributed feedback lasers; dose rate; electrical response; laser cavity; laser diode response; laser emission; net current density; optical power; optical response; positive photocurrent; pulsed electrical characterizations; pulsed electrical excitations; pulsed radiative excitations; second order phenomena; substrate photocurrent; transient conduction; transient irradiation; Carrier confinement; Charge carrier density; Current density; Diode lasers; Laser excitation; Optical pulse generation; Optical pulses; Optical refraction; Optical variables control; Photoconductivity;
Journal_Title :
Nuclear Science, IEEE Transactions on
