DocumentCode
1319524
Title
Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations
Author
Barnaby, W. ; Tausch, H.J. ; Turfler, R. ; Cole, P. ; Baker, P. ; Pease, R.L.
Author_Institution
Mission Res. Corp., Albuquerque, NM, USA
Volume
43
Issue
6
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
3040
Lastpage
3048
Abstract
A methodology is presented for the identification of circuit total dose response mechanisms in bipolar linear microcircuits irradiated at high and low dose rates. This methodology includes manual circuit analysis, circuit simulations with SPICE using extracted device parameters, and selective irradiations of portions of the circuit using a scanning electron microscope
Keywords
SPICE; bipolar analogue integrated circuits; circuit analysis computing; electron beam effects; gamma-ray effects; integrated circuit testing; scanning electron microscopy; SPICE; bipolar linear circuit; circuit analysis; circuit response mechanisms; circuit simulations; dose rates; extracted device parameters; gamma-ray effects; scanning electron microscope; total dose irradiations; Circuit analysis; Circuit simulation; Cranes; Degradation; Failure analysis; Linear circuits; Manuals; SPICE; Scanning electron microscopy; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.556903
Filename
556903
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