• DocumentCode
    1320026
  • Title

    Adding error-correcting circuitry to ASIC memory

  • Author

    Gray, Ken

  • Author_Institution
    Philips Semicond., Chelmsford, MA, USA
  • Volume
    37
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    Thinking of putting ROM or RAM onto an application-specific IC? Then consider adding error-correction code (ECC) circuitry as well. Its presence boosts yield and reduces problems with random single-cell defects in memory arrays. Admittedly, the addition also expands chip area and impacts performance, but the payoff is almost always worth it. For instance, a memory that uses ECC will be more reliable in the field because a single memory cell failure will be corrected and not bring down the system; moreover, the now defective system component will not have to be replaced until the next scheduled maintenance. In fact, with ECC, 1 bit in every memory word can be bad and the memory will still operate correctly.
  • Keywords
    application specific integrated circuits; error correction codes; memory architecture; random-access storage; read-only storage; ASIC memory; XOR logic design; chip area; error-correcting circuitry; memory arrays; memory cell failure; performance; random single-cell defects; yield improvement; Alpha particles; Application specific integrated circuits; Error correction; Error correction codes; FCC; Parity check codes; Petroleum; Random access memory; Read only memory; Read-write memory;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.833029
  • Filename
    833029