Title :
Genetic algorithms for VLSI design, layout, and test automation [Reviews]
Author :
Manganaro, Gabriele
Author_Institution :
Texas Instrument´s Inc.
fDate :
3/1/2000 12:00:00 AM
Keywords :
Algorithm design and analysis; Automatic testing; Books; Circuits; Content addressable storage; Design automation; Genetic algorithms; Macrocell networks; Routing; Very large scale integration;
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.2000.833032