DocumentCode :
1320050
Title :
Magneto-Transport Study of Pure and Co Doped ZnO Thin Films
Author :
Ghoshal, Sayak ; Kumar, P. S Anil
Author_Institution :
Dept. of Phys., Indian Inst. of Sci., Bangalore, India
Volume :
48
Issue :
11
fYear :
2012
Firstpage :
3426
Lastpage :
3429
Abstract :
A detailed low temperature magneto-transport study is carried out to understand the transport mechanism in pure and Co doped ZnO thin films grown by pulsed laser deposition (PLD) technique. A negative transverse magneto-resistance (MR) (with a value ~ 4% at 4.5 K) which decreases monotonically with the increase in temperature, is observed for the undoped ZnO film. A competition between positive and negative MR is observed for the Co doped ZnO samples. In this case at higher field values negative MR contribution dominates over the positive MR, which gives rise to a slope change in the MR data. Our data for MR shows excellent agreement with the semi-empirical formula given by Khosla , which is originally proposed for the degenerate semiconductors. This formula incorporates the third order perturbation expansion of the s-d exchange scattering of the conduction electrons from the localised spins. We have also obtained the Hall mobility, carrier conc. and mean free path as function of temperature for the pure ZnO film.
Keywords :
Hall mobility; II-VI semiconductors; carrier density; carrier mean free path; cobalt; degenerate semiconductors; exchange interactions (electron); magnetic thin films; magnetoresistance; negative resistance; perturbation theory; pulsed laser deposition; semiconductor growth; semiconductor thin films; semimagnetic semiconductors; spin dynamics; wide band gap semiconductors; zinc compounds; Hall mobility; ZnO; ZnO:Co; carrier concentration; degenerate semiconductors; dilute magnetic semiconductor; electron conduction; localised spins; low-temperature magnetotransport properties; mean free path; negative transverse magnetoresistance; pulsed laser deposition; s-d exchange scattering; temperature 4.5 K; thin films; third-order perturbation expansion; Absorption; Doping; Magnetic resonance imaging; Resistance; Scattering; Temperature measurement; Zinc oxide; Dilute magnetic semiconductors (DMSs); magnetoresistance; zinc oxide;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2012.2196031
Filename :
6332569
Link To Document :
بازگشت