Measurement of phase and amplitude error distributions in InP-based arrayed-waveguide grating multi/demultiplexers

Author

Yamada, Hiroyoshi ; Sanjoh, H. ; Kohtoku, M. ; Takada, Kazumasa

Author_Institution

NTT Photonics Labs., Ibaraki

Volume

36

Issue

2

fYear

2000

fDate

1/20/2000 12:00:00 AM

Firstpage

136

Lastpage

138

Abstract

The authors have measured the phase and amplitude error distributions in an InP-based arrayed-waveguide grating (AWG) multi/demultiplexer using Fourier transform spectroscopy and signal data processing. The signal data processing technique was based on wavenumber scale transformation and was applied to reduce the effect of second-order dispersion in a measured interferogram. The results reveal that the main origins of the crosstalk and dispersion in an InP-based AWG are random and slowly-varying phase errors, respectively

Keywords

Fourier transform spectroscopy; III-V semiconductors; demultiplexing equipment; diffraction gratings; indium compounds; multiplexing equipment; optical communication equipment; optical crosstalk; optical dispersion; wavelength division multiplexing; Fourier transform spectroscopy; InP; amplitude error distributions; arrayed-waveguide grating demultiplexers; arrayed-waveguide grating multiplexers; crosstalk; phase error distributions; random phase errors; second-order dispersion; signal data processing; slowly-varying phase errors; wavenumber scale transformation;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20000146

Filename

833143