DocumentCode
1320927
Title
Radio Frequency Magnetic Near Field Measurements of Coplanar Waveguide Simulated Power and Ground Lines in Radio Frequency Integrated Circuits Using a MFM Tip
Author
Endo, Yasushi ; Fukushima, Masaaki ; Arai, Kaoru ; Shimada, Yutaka ; Yamaguchi, Masahiro
Author_Institution
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Volume
48
Issue
11
fYear
2012
Firstpage
3666
Lastpage
3669
Abstract
This paper describes our study on high-resolution measurements of the distribution of the radio frequency (RF) magnetic near field from a coplanar waveguide (CPW) with a size similar to power and ground lines in radio frequency integrated circuit chips using a magnetic force microscope tip and amplitude modulation of the line current. Cantilever resonance frequency modulation of approximately 25 kHz supplies the CPW with current and carrier frequencies up to 0.1 GHz. The CPW has a signal line width of 3 μm and a ground line width of 50 μm. The oscillation amplitudes of the tip with and without a DC magnetic field indicates that the distribution of the RF magnetic near field in the proximity of the CPW can be observed for a carrier frequency up to 0.1 GHz. This result also suggests that this method has potential as a new technique for high-resolution RF field measurements.
Keywords
amplitude modulation; cantilevers; coplanar waveguides; magnetic force microscopy; radiofrequency integrated circuits; radiofrequency measurement; MFM tip; RF field measurement; RF magnetic near field; amplitude modulation; cantilever resonance frequency modulation; coplanar waveguide; ground line; high-resolution measurement; magnetic force microscope tip; radio frequency integrated circuit chip; radio frequency magnetic near field distribution; radio frequency magnetic near field measurement; size 3 mum; size 50 mum; Coplanar waveguides; Frequency measurement; Frequency modulation; Magnetic resonance; Magnetic separation; Radio frequency; Amplitude modulation; RF magnetic near field; coplanar waveguide (CPW); magnetic force microscope (MFM);
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2012.2204968
Filename
6332711
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