Title :
Spectrally Sampled OCT Imaging Based on 1.7-μm Continuous-Wave Supercontinuum Source
Author :
Eun Joo Jung ; Ju Han Lee ; Byung Sup Rho ; Myoung Jin Kim ; Sung Hwan Hwang ; Woo-Jin Lee ; Jae-Jin Song ; Myung Yung Jeong ; Chang-Seok Kim
Author_Institution :
Nano-Photonics Res. Center, Korea Photonics Technol. Inst., Gwangju, South Korea
Abstract :
We demonstrate a novel multiwavelength light source around the 1.7-μm region based on continuous-wave (CW) supercontinuum (SC) generation for the deeper imaging of low-water-absorption sample with a spectrally sampled optical coherence tomography (OCT) system. This self-regulated Gaussian spectrum of CW SC source has an extremely smooth flat width with more than 210-nm full-width at half-maximum bandwidth centered at the 1.7-μm region, a high output power of 500 mW, and a low temporal instability with less than 0.1 dB for an hour. In order to improve the OCT signal sensitivity without increasing the optical illumination power, a multiwavelength light source based on this CW SC was implemented by using a tunable fiber Sagnac comb filter. When it was applied to the spectrally sampled OCT imaging, the multiwavelength light source enabled a dynamic range improvement, compared to conventional continuous spectral light source with the same average optical power.
Keywords :
light sources; optical fibres; optical tomography; supercontinuum generation; OCT signal sensitivity; continuous-wave supercontinuum source; deeper imaging; half-maximum bandwidth; high output power; low temporal instability; low-water-absorption sample; multiwavelength light source; optical illumination power; power 500 mW; self-regulated Gaussian spectrum; spectrally sampled OCT imaging; time 1 hour; tunable fiber Sagnac comb filter; wavelength 1.7 mum; Light sources; Optical fiber dispersion; Optical fibers; Optical filters; Optical imaging; Continuous-wave (CW) supercontinuum (SC) source; Sagnac effect; fiber optics; optical coherence tomography (OCT);
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2011.2167962