DocumentCode :
1321315
Title :
Simultaneous Measurement of Film Deformation and Friction Force During Shearing of Molecularly Thin Lubricants
Author :
Kajihara, Yosuke ; Fukuzawa, Kenji ; Itoh, Shintaro ; Watanabe, Ryota ; Zhang, Hedong
Author_Institution :
Dept. of Micro/Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
Volume :
48
Issue :
11
fYear :
2012
Firstpage :
4455
Lastpage :
4458
Abstract :
The shearing deformation of the lubricant film was measured by using two-stage imaging ellipsometric microscope (TIEM) combined with an optical-fiber-based friction force measurement method. The TIEM enables high-lateral-resolution and real-time measurements of the thickness distribution of the nanometer-thick lubricant films during shearing. By adding a relay lenses illumination system and a high-power LED light source to the TIEM, a thickness resolution of 0.14 nm was achieved. The results of an experiment using this apparatus demonstrated that the asynchronous component of the probe oscillation, which is induced by friction force between the probe and lubricant or disk and corresponds to acoustic emission avalanches in the head-disk interface of hard disk drives, can occur when the probe is in contact with the lubricant film. The time constant of replenishment of the sheared lubricant film was of the order of hundreds of microseconds, which is much shorter than the timescale of diffusion phenomena.
Keywords :
acoustic emission; ellipsometry; friction; hard discs; liquid films; lubricants; nanostructured materials; shear deformation; shearing; acoustic emission; diffusion; film deformation; friction force; hard disk drives; head-disk interface; high-power LED light source; illumination lenses system; molecular thin film lubricants; nanometer-thick lubricant films; optical fiber-based friction force measurement method; probe oscillation; shearing deformation; size 0.14 nm; thickness distribution; time constant; two-stage imaging ellipsometric microscopy; Force measurement; Friction; Imaging; Lubricants; Optical variables measurement; Probes; Shearing; Acoustic emission (AE); ellipsometry; head-disk interface (HDI); lubrication; microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2012.2197600
Filename :
6332779
Link To Document :
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