DocumentCode :
1321495
Title :
Microstructural characterization of materials [Book Reveiw]
Author :
Shea, John
Volume :
16
Issue :
2
fYear :
2000
Firstpage :
38
Lastpage :
38
Keywords :
Books; Disk recording; Optical films; Optical materials; Optical microscopy; Optical recording; Soil; Spectroscopy; X-ray diffraction; X-ray imaging;
fLanguage :
English
Journal_Title :
Electrical Insulation Magazine, IEEE
Publisher :
ieee
ISSN :
0883-7554
Type :
jour
DOI :
10.1109/MEI.2000.833652
Filename :
833652
Link To Document :
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