DocumentCode

1321495

Title

Microstructural characterization of materials [Book Reveiw]

Author

Shea, John

Volume

16

Issue

2

fYear

2000

Firstpage

38

Lastpage

38

Keywords

Books; Disk recording; Optical films; Optical materials; Optical microscopy; Optical recording; Soil; Spectroscopy; X-ray diffraction; X-ray imaging;

fLanguage

English

Journal_Title

Electrical Insulation Magazine, IEEE

Publisher

ieee

ISSN

0883-7554

Type

jour

DOI

10.1109/MEI.2000.833652

Filename

833652