Magnetic Properties of Enhanced Permeability Dielectrics for Nanomagnetic Logic Circuits

Author

Li, Peng ; Sankar, Vijay K. ; Csaba, Gyorgy ; Hu, Xiaobo Sharon ; Niemier, Michael ; Porod, Wolfgang ; Bernstein, Gary H.

Author_Institution

Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA

Volume

48

Issue

11

fYear

2012

Firstpage

3292

Lastpage

3295

Abstract

Enhanced permeability dielectric (EPD) samples were fabricated in an ultra-high-vacuum magnetron sputtering system, and their magnetic properties were studied by a variable-temperature vibrating sample magnetometer. EPDs were fabricated with layers of CoFe forming uniform particles separated by MgO dielectric as insulator. The optimal sample has peak relative low-field permeability (μ_r) of 452, saturation magnetization (M_s) of 636 emu/cm³ and magnetization at 100 Oe (M_{100 Oe}) of 398 emu/cm³. Effect of low temperature is discussed, and measurements show that the EPD remains superparamagnetic at 173 K; μ_r, M_s and M_{100 Oe} values at reduced temperatures are higher than those at room temperature. The sample is ferromagnetic at 100 K.

Keywords

dielectric materials; ferromagnetic materials; logic circuits; magnesium compounds; magnetisation; nanomagnetics; permeability; sputtering; MgO; MgO dielectric; enhanced permeability dielectrics; ferromagnetic; insulator; low temperature effect; magnetic property; magnetometer. EPD; nanomagnetic logic circuit; peak relative low-field permeability; saturation magnetization; temperature 100 K; temperature 173 K; ultra-high-vacuum magnetron sputtering; variable-temperature vibrating sample; Argon; Dielectrics; Magnetization; Permeability; Saturation magnetization; Sputtering; Temperature; Enhanced permeability dielectrics (EPDs); relative permeability; saturation magnetization; superparamagnetic;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2012.2204236

Filename

6332818