Title : 
Parametric Representation of Probability in Two DimensionsߞA New Approach in System Reliability Evaluation
         
        
            Author : 
Banerjee, S.K. ; Rajamani, K.
         
        
            Author_Institution : 
Department of Electrical Engineering, Indian Institute of Technology, Bombay, India.
         
        
        
        
        
        
            Abstract : 
The evaluation of system reliability becomes very diffilcult when the number of components in a system is large or the system configuration is complex. This note presents a straightforward method for system reliability evaluation. Probability is treated as a point in a Cartesian frame and formulas are derived to evaluate the reliability of series, parallel, series-parallel, and bridge networks. The values obtained by the classical method agree closely with those obtained by this parametric method.
         
        
            Keywords : 
Bridge circuits; Bridges; Equations; Probability; Reliability;
         
        
        
            Journal_Title : 
Reliability, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TR.1972.5216173