Title :
Parametric Representation of Probability in Two DimensionsߞA New Approach in System Reliability Evaluation
Author :
Banerjee, S.K. ; Rajamani, K.
Author_Institution :
Department of Electrical Engineering, Indian Institute of Technology, Bombay, India.
Abstract :
The evaluation of system reliability becomes very diffilcult when the number of components in a system is large or the system configuration is complex. This note presents a straightforward method for system reliability evaluation. Probability is treated as a point in a Cartesian frame and formulas are derived to evaluate the reliability of series, parallel, series-parallel, and bridge networks. The values obtained by the classical method agree closely with those obtained by this parametric method.
Keywords :
Bridge circuits; Bridges; Equations; Probability; Reliability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1972.5216173