Title :
Formation of 1:13 Phase in La(Fe,Si)
-Based Compounds by Diffusion of LaFe,Si
Author :
Song, Fu ; Yi, Long ; Chaolun, Wang ; Min, Zhang ; Soumei, Ohnuki ; Fengxia, Hu
Author_Institution :
Sch. of Mater. Sci. & Eng., Univ. of Sci. & Technol. Beijing, Beijing, China
Abstract :
Formation mechanism of the 1:13 phase in La(Fe,Si)13 compounds has been investigated by the diffusion of LaFeSi/α-Fe(Si) couple at 1353 K and 1443 K. After annealing at 1353 K for 12 days, 0.8 mm thick 1:13 phase was obtained between LaFeSi and α-Fe(Si) sheets. A layer of La5Si3 phase determined by EDS appeared all along the interface of LaFeSi and 1:13 phase. In addition, La5Si3 phase was also found in grain boundary of 1:13 phase grains and La-rich phase was found in grain boundary of α-Fe(Si) sheet. It is believed that La5Si3 phase and grain boundaries working as rapid diffusion paths were important for the formation of 1:13 phase in La(Fe,Si)13 compounds. 1:13 phase mainly formed in the α-Fe(Si) master alloy sheet. In addition, large grains of 1:13 phase were close to the LaFeSi sheet and small grains of 1:13 phase were close to α-Fe(Si) layer. It indicated that La and Si elements diffused from LaFeSi sheet to α-Fe(Si) sheet in the formation process of 1:13 phase. There was an endothermic peak at 207 K in the DSC curve of the 1:13 phase obtained from diffusion couple annealed at 1353K. It indicated the occurrence of magnetic phase transition.
Keywords :
X-ray chemical analysis; annealing; differential scanning calorimetry; diffusion; forming processes; grain boundaries; iron alloys; lanthanum alloys; magnetic transitions; silicon alloys; DSC; EDS; La(FeSi)13-FeSi; annealing; differential scanning calorimetry; energy dispersive X-ray analysis; formation mechanism; grain boundaries; magnetic phase transition; rapid diffusion; size 0.8 mm; temperature 1353 K; temperature 1443 K; time 12 day; Annealing; Compounds; Grain boundaries; Iron; Silicon; La-Fe-Si; magnetic materials; magnetic refrigeration; materials preparation;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2199964