DocumentCode :
1321852
Title :
CW high power single-lobed far-field operation of long-cavity AlGaAs-GaAs single-quantum-well laser diodes grown by MOCVD
Author :
Gavrilovic, P. ; Timofeev, F.N. ; Haw, T. ; Williams, J.E.
Author_Institution :
Polaroid Corpo., Cambridge, MA, USA
Volume :
27
Issue :
7
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
1859
Lastpage :
1862
Abstract :
Data on long-cavity 100-μm-wide broad-stripe laser diodes that lase with a barrow single-lobed far-field pattern in continuous room-temperature operation are presented. Diodes with a cavity length of 1250 μm emit a power of 200 mW per facet into a 2.5° lobe (full width at half maximum). Short-cavity devices (cavity length of 350 μm) lase with a continuously increasing number of lateral modes right from threshold, and exhibit a far-field divergence that is over three times greater than that of 1250-μm diodes. Explanations for the effect of increasing cavity length on the field patterns of these devices are proposed, based on the measured increase in injected carrier diffusion length in long-cavity diodes and the influence of thermal waveguiding and mirror losses on intermodel discrimination
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; laser modes; semiconductor growth; semiconductor junction lasers; semiconductor quantum wells; vapour phase epitaxial growth; 100 micron; 1250 micron; CW high power single-lobed far-field operation; III-V semiconductors; MOCVD; barrow single-lobed far-field pattern; broad-stripe laser diodes; cavity length; continuous room-temperature operation; facet; far-field divergence; injected carrier diffusion length; intermodel discrimination; lateral modes; long cavity AlGaAs-GaAs single quantum well laser diodes; mirror losses; thermal waveguiding; Diode lasers; Gallium arsenide; Laboratories; Length measurement; Loss measurement; MOCVD; Microelectronics; Mirrors; Power lasers; Semiconductor diodes;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.83387
Filename :
83387
Link To Document :
بازگشت