• DocumentCode
    1321926
  • Title

    Computer model of the electron-beam excited XeF(B-X ) laser

  • Author

    Abarenov, Andrey V. ; Persiantsev, Igor G. ; Rakhimov, A.T. ; Rebrick, Sergey P. ; Shugai, Julia S. ; Suetin, N.V.

  • Author_Institution
    Dept. of Microelectron., Moscow State Univ., USSR
  • Volume
    27
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    1946
  • Lastpage
    1953
  • Abstract
    The authors report results on the computer simulation of electron-beam pumped XeF lasers user common conditions, as well as under elevated temperature and high pumping rates that are known to improve laser performance. The Boltzmann equation for the electron energy distribution function and the chemical kinetics equations were solved in a consistent manner. The model took into account five vibrational levels of the electronic B state and seven levels for the C and X states of the XeF molecule. The model used gives reasonable agreement with the results of small signal gain measurements. A method of taking into account the finite rate of rotational relaxation makes it possible to obtain time dependencies of the lasing power in different spectral bands that qualitatively agree with those measured in experiments at different temperatures and pump rates
  • Keywords
    digital simulation; electron beam applications; excimer lasers; molecular rotation-vibration; xenon compounds; Boltzmann equation; XeF molecule; chemical kinetics equations; computer simulation; electron beam pumped XeF lasers; electron energy distribution function; electronic B state; elevated temperature; laser performance; lasing power; pumping rates; rotational relaxation; small signal gain measurements; spectral bands; time dependencies; vibrational levels; Boltzmann equation; Chemical lasers; Computer simulation; Distribution functions; Electrons; High performance computing; Laser excitation; Laser modes; Pump lasers; Temperature;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.83397
  • Filename
    83397