Edge Effect on Thermally Excited Mag-Noise in Magnetic Tunnel Junction Sensors

Author

Zeng, T. ; Zhou, Y. ; Lin, K.W. ; Lai, P.T. ; Pong, P.W.T.

Author_Institution

Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China

Volume

48

Issue

11

fYear

2012

Firstpage

2831

Lastpage

2834

Abstract

Thermally excited magnetic noise (mag-noise) has gradually become a major concern in magnetic tunnel junction sensors. By conducting micromagnetic simulation, the spatial distribution of thermal mag-noise in the free layer (FL) was obtained under various hard bias (HB) field and applied field. It was demonstrated that the edges are the main contributor of thermal mag-noise in the FL. This result could be explained by the nonuniform distribution of the stiffness field around the edges. It was also found that both HB field and applied field could suppress the thermal mag-noise in edges. A relatively high applied field will decrease the influence of HB field on mag-noise in the edges.

Keywords

magnetic noise; magnetic tunnelling; micromagnetics; edge effect; hard bias field; magnetic noise; magnetic tunnel junction sensor; micromagnetic simulation; spatial distribution; stiffness field; thermally excited magnoise; Magnetic resonance; Magnetic tunneling; Magnetization; Noise; Thermal noise; Thermal sensors; Applied field; edges; free layer (FL); hard bias field; magnetic tunnel junction (MTJ); spatial distribution; thermal mag-noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2012.2198201

Filename

6332899