Title :
Group delay measurements of optical components near 800 nm
Author :
Beck, M. ; Walmsley, I.A. ; Kafka, J.D.
Author_Institution :
Inst. of Opt., Rochester Univ., NY, USA
fDate :
8/1/1991 12:00:00 AM
Abstract :
Phase-locked interferometry was used to measure the group delay of several optical components in the spectral region 700-850 nm. The dispersive and absorptive properties of several different types of linear filters were measured. Measurements of the absorption and dispersion of several linear, causal optical filters show that a generalized Kramers-Kronig relation does not exist for many commonly used filters. This result emphasizes the importance of making direct measurements of the dispersive properties of filters, since the dispersion of a linear filter cannot always be determined from a measurement of its absorption. Data are presented for a birefringent filter, dielectric mirror, Gires-Tournois interferometer, and titanium-doped sapphire
Keywords :
birefringence; light absorption; light interferometry; optical dispersion; optical filters; optical testing; 700 to 850 nm; Al2O3:Ti; Gires-Tournois interferometer; Ti doped sapphire; absorptive properties; birefringent filter; causal optical filters; dielectric mirror; dispersive properties; generalized Kramers-Kronig relation; group delay measurement; linear filters; optical components; Absorption; Birefringence; Delay; Dielectric measurements; Dispersion; Nonlinear filters; Optical devices; Optical filters; Optical interferometry; Phase measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of