• DocumentCode
    1322070
  • Title

    Group delay measurements of optical components near 800 nm

  • Author

    Beck, M. ; Walmsley, I.A. ; Kafka, J.D.

  • Author_Institution
    Inst. of Opt., Rochester Univ., NY, USA
  • Volume
    27
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    2074
  • Lastpage
    2081
  • Abstract
    Phase-locked interferometry was used to measure the group delay of several optical components in the spectral region 700-850 nm. The dispersive and absorptive properties of several different types of linear filters were measured. Measurements of the absorption and dispersion of several linear, causal optical filters show that a generalized Kramers-Kronig relation does not exist for many commonly used filters. This result emphasizes the importance of making direct measurements of the dispersive properties of filters, since the dispersion of a linear filter cannot always be determined from a measurement of its absorption. Data are presented for a birefringent filter, dielectric mirror, Gires-Tournois interferometer, and titanium-doped sapphire
  • Keywords
    birefringence; light absorption; light interferometry; optical dispersion; optical filters; optical testing; 700 to 850 nm; Al2O3:Ti; Gires-Tournois interferometer; Ti doped sapphire; absorptive properties; birefringent filter; causal optical filters; dielectric mirror; dispersive properties; generalized Kramers-Kronig relation; group delay measurement; linear filters; optical components; Absorption; Birefringence; Delay; Dielectric measurements; Dispersion; Nonlinear filters; Optical devices; Optical filters; Optical interferometry; Phase measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.83423
  • Filename
    83423