Title :
An Open- and Short-Circuit Technique for Analyzing Electronic Circuits
Author_Institution :
Department of Electrical Engineering, University of Texas at Arlington, Arlington, TX 76019.
Abstract :
A simple approach is presented to analyze a typical high-frequency transistor stage. The analysis is based on eliminating some troublesome circuit element by open-circuiting and short-circuiting. As shown by an example, results are obtained almost by inspection.
Keywords :
Bandwidth; Capacitors; Impedance; Instruments; Measurement uncertainty; Steady-state; Transistors;
Journal_Title :
Education, IEEE Transactions on
DOI :
10.1109/TE.1987.5570587
