• DocumentCode
    1322230
  • Title

    An Open- and Short-Circuit Technique for Analyzing Electronic Circuits

  • Author

    Yeung, Kai S.

  • Author_Institution
    Department of Electrical Engineering, University of Texas at Arlington, Arlington, TX 76019.
  • Issue
    1
  • fYear
    1987
  • Firstpage
    55
  • Lastpage
    56
  • Abstract
    A simple approach is presented to analyze a typical high-frequency transistor stage. The analysis is based on eliminating some troublesome circuit element by open-circuiting and short-circuiting. As shown by an example, results are obtained almost by inspection.
  • Keywords
    Bandwidth; Capacitors; Impedance; Instruments; Measurement uncertainty; Steady-state; Transistors;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.1987.5570587
  • Filename
    5570587
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1322230