DocumentCode
1322491
Title
Lower Confidence Limits for Availability Assuming Lognormally Distributed Repair Times
Author
Gray, Henry L. ; Schucany, William R.
Author_Institution
LTV Electrosystems, Inc., Greenville, Tex.; Texas Technological college, Lubbock, Tex.
Issue
4
fYear
1969
Firstpage
157
Lastpage
162
Abstract
Exact lower confidence limits are established for the availability ratio A where A = ¿y/(¿y + ¿x) and ¿y is the mean time between failures and ¿x is the mean time to repair. It is assumed that the time between failures has an exponential distribution while the time to repair is log-normally distributed, with known variance. A test of the hypothesis A = Ao is also developed and power curves are included. Some results on the comparison of confidence intervals when the time to repair is assumed to be exponentially distributed are given.
Keywords
Availability; Exponential distribution; Failure analysis; Gaussian distribution; Manufacturing; Probability distribution; Random variables; Reactive power; Reliability engineering; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1969.5216343
Filename
5216343
Link To Document