• DocumentCode
    1322491
  • Title

    Lower Confidence Limits for Availability Assuming Lognormally Distributed Repair Times

  • Author

    Gray, Henry L. ; Schucany, William R.

  • Author_Institution
    LTV Electrosystems, Inc., Greenville, Tex.; Texas Technological college, Lubbock, Tex.
  • Issue
    4
  • fYear
    1969
  • Firstpage
    157
  • Lastpage
    162
  • Abstract
    Exact lower confidence limits are established for the availability ratio A where A = ¿y/(¿y + ¿x) and ¿y is the mean time between failures and ¿x is the mean time to repair. It is assumed that the time between failures has an exponential distribution while the time to repair is log-normally distributed, with known variance. A test of the hypothesis A = Ao is also developed and power curves are included. Some results on the comparison of confidence intervals when the time to repair is assumed to be exponentially distributed are given.
  • Keywords
    Availability; Exponential distribution; Failure analysis; Gaussian distribution; Manufacturing; Probability distribution; Random variables; Reactive power; Reliability engineering; Testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1969.5216343
  • Filename
    5216343