Title :
Noise Spectral Density as a Diagnostic Tool for Reliability of p-n Junctions
Author :
Kim, Y.D. ; Misra, R.P.
Author_Institution :
Newark College of Engineering, Newark, N.J.; U.S. Naval Ammunition Depot, Crane, Ind.
Keywords :
Breakdown voltage; Degradation; Electric breakdown; Life testing; Low-frequency noise; P-n junctions; Semiconductor device noise; Semiconductor device reliability; Semiconductor devices; Semiconductor diodes;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1969.5216352
