• DocumentCode
    1322620
  • Title

    Correlation between the structure and the piezoelectric properties of lead-free (K,Na,Li)(Nb,Ta,Sb)O3 ceramics studied by XRD and Raman spectroscopy

  • Author

    Rubio-Marcos, F. ; Marchet, P. ; Romero, J.J. ; Fernandez, J.F.

  • Author_Institution
    Lab. de Sci. des Procades Ceramiques et de Traitements de Surface, Univ. de Limoges, Limoges, France
  • Volume
    58
  • Issue
    9
  • fYear
    2011
  • fDate
    9/1/2011 12:00:00 AM
  • Firstpage
    1826
  • Lastpage
    1834
  • Abstract
    This article reviews on the use of Raman spectroscopy for the study of (K,Na,Li)(Nb,Ta,Sb)O3 lead-free piezoceramics. Currently, this material appears to be one of the most interesting and promising alternatives to the well-known PZT piezoelectric materials. In this work, we prepare piezoceramics with different stoichiometries and study their structural, ferroelectric, and piezoelectric properties. By using both Raman spectroscopy and X-ray diffraction, we establish a direct correlation between the structure and the properties. The results demonstrate that the wavenumber of the A1g vibration is proportional to the tetragonality, the remnant polarization, and the piezoelectric coefficients of these materials. Thus, Raman spectroscopy appears as a very useful technique for a fast evaluation of the crystalline structure and the ferroelectric/ piezoelectric properties.
  • Keywords
    Raman spectra; X-ray diffraction; crystal structure; dielectric polarisation; ferroelectric ceramics; ferroelectricity; lithium compounds; piezoceramics; piezoelectricity; potassium compounds; reviews; sodium compounds; stoichiometry; (KNaLi)(NbTaSb)O3; PZT piezoelectric materials; Raman spectroscopy; X-ray diffraction; XRD; crystalline structure; ferroelectric properties; lead-free piezoceramics; piezoelectric coefficients; piezoelectric properties; remnant polarization; stoichiometries; structural properties; tetragonality; wavenumber; Ceramics; Correlation; Powders; Raman scattering; Temperature measurement; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2011.2020
  • Filename
    6020851