Title :
Measurement and modeling of dielectric properties of Pb(Zr,Ti)O3 ferroelectric thin films
Author :
Renoud, R. ; Borderon, Caroline ; Gundel, Hartmut W.
Author_Institution :
Inst. de Rech. en Electrotech. et Electron. de Nantes Atlantique (IREENA), Univ. of Nantes, Nantes, France
fDate :
9/1/2011 12:00:00 AM
Abstract :
In this study, the real and imaginary parts of the complex permittivity of lead zirconate titanate ferroelectric thin films are studied in the frequency range of 100 Hz to 100 MHz. The permittivity is well fitted by the Cole-Cole model. The variation of the relaxation time with the temperature is described by the Arrhenius law and an activation energy of 0.38 eV is found. Because of its nonlinear character, the dielectric response of the ferroelectric sample depends on the amplitude of the applied ac electric field. The permittivity is composed of three different contributions: the first is due to intrinsic lattice, the second is due to domain wall vibrations, and the third is due to domain wall jumps between pinning centers. This last contribution depends on the electric field, so it is important to control the field amplitude to obtain the desired values of permittivity and tunability.
Keywords :
dielectric relaxation; electric domain walls; ferroelectric thin films; lead compounds; permittivity; Arrhenius law; Cole-Cole model; PZT; Pb(Zr,Ti)O3 ferroelectric thin films; activation energy; complex permittivity; dielectric properties; dielectric response; domain wall jumps; domain wall vibrations; frequency 100 Hz to 100 MHz; intrinsic lattice; lead zirconate titanate ferroelectric thin films; pinning centers; relaxation time variation; tunability; Dielectrics; Electric fields; Films; Permittivity; Permittivity measurement; Temperature measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2011.2040