Automated measurement of optical coherence lengths and optical delays for applications in coherence-modulated optical transmissions

Author

Gutiérrez-Martínez, Celso ; Sanchez-Rinza, B. ; Rodriguez-Asomoza, J. ; Pedraza-Contreras, Jesús

Author_Institution

Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico

Volume

49

Issue

1

fYear

2000

fDate

2/1/2000 12:00:00 AM

Firstpage

32

Lastpage

36

Abstract

The implementation of an automated system for analysis of coherence length of light and for the measurement of optical delays is reported. This type of measurement is very important for designing coherence-modulated optical transmission systems. Such systems have been studied for the last few years as new potential high-speed optical links useful for point-to-point, local area networks, and bidirectional transmissions, at optical wavelengths around 1300 nm. The main characteristics of coherence-modulated transmissions include the need of using low-coherence optical sources and integrated optics lithium niobate (LiNbO₃) electro-optic retarders. This paper describes the implementation of an automated system allowing the measurement of coherence lengths of semiconductor optical sources and also optical delays as essential data for designing coherence-modulated optical links. The reported results include characterization of commercial low-coherence semiconductor optical sources and integrated optics coherence modulators

Keywords

Michelson interferometers; electro-optical modulation; integrated optics; laser variables measurement; light coherence; light interferometry; optical fibre communication; optical variables measurement; semiconductor lasers; superluminescent diodes; LiNbO₃; Michelson interferometer; automated measurement; coherence-modulated optical transmissions; high-speed optical fiber links; integrated optic electro-optic retarders; low-coherence optical sources; optical coherence lengths; optical delays; optical path differences; semiconductor optical sources; superluminescent diode; two-wave interferometer; Delay; High speed optical techniques; Integrated optics; Length measurement; Optical design; Optical fiber LAN; Optical fiber communication; Optical modulation; Optical retarders; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.836305

Filename

836305