DocumentCode
1322920
Title
Authors´ reply
Author
Glinski, G. S. ; De Mercado, J. B. ; Thompson, Peter M.
Author_Institution
Dept. Elec. Engrg., University of Ottawa, Ottawa, Ont., Canada
Issue
3
fYear
1970
Firstpage
123
Lastpage
123
Keywords
Bayesian methods; Costs; Data analysis; Degradation; Markov processes; Prediction theory; Reliability engineering; Reliability theory; Stochastic systems; Time measurement;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1970.5216421
Filename
5216421
Link To Document