Author :
Glinski, G. S. ; De Mercado, J. B. ; Thompson, Peter M.
Author_Institution :
Dept. Elec. Engrg., University of Ottawa, Ottawa, Ont., Canada
Keywords :
Bayesian methods; Costs; Data analysis; Degradation; Markov processes; Prediction theory; Reliability engineering; Reliability theory; Stochastic systems; Time measurement;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1970.5216421
