Title :
Frequency Stability Analysis of a Grounded-Base Voltage-Controlled Crystal Oscillator
Author_Institution :
Hewlett-Packard Company, Waltham, Mass.
Abstract :
The frequency stability is analyzed for a voltage-controlled grounded-base crystal oscillator by matrix algebra. The validity of the resulting equation was verified by measurements on an oscillator with a 110-MHz fifth-overtone quartz crystal. Sensitivity coefficients for the oscillator are computed with the aid of a time share computer program and its sweep range is drawn by a plotting routine.
Keywords :
Capacitors; Crystals; Equations; Oscillators; Sensitivity; Stability analysis; Transistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1971.5570718
