DocumentCode
1322974
Title
Active I-V Characteristic Measurement
Author
Manasse, F. K.
Author_Institution
Thayer School of Engineering, Dartmouth College, Hanover, N. H.
Issue
3
fYear
1971
Firstpage
177
Lastpage
178
Abstract
The use of I-V characteristics to determine the behavior of active devices is increasing. The standard swept frequency schemes suffer from frequency limitations. A technique for pulsed I-V measurements that can be employed in most laboratories is described and its application to measuring the active behavior of an IMPATT device is demonstrated.
Keywords
Current measurement; Multiplexing; Oscilloscopes; Plasma measurements; Pulse measurements; Switches; Voltage measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1971.5570722
Filename
5570722
Link To Document