Title :
Comparative Study of Convolution and Order Reduction Techniques for Blackbox Macromodeling Using Scattering Parameters
Author :
Schutt-Ainé, José E. ; Goh, Patrick ; Mekonnen, Yidnekachew ; Tan, Jilin ; Al-Hawari, Feras ; Liu, Ping ; Dai, Wenliang
Author_Institution :
Electr. Eng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
In this paper, a fast convolution method using scattering parameters is presented for the macromodeling of blackbox multiport networks. The method is compared to model-order reduction passive macromodeling techniques in terms of robustness and computational efficiency. When scattering parameters are used as the transfer functions, convolution calculations can be accelerated to achieve superior performance and the resulting procedure leads to a robust, accurate, and efficient macromodel generation scheme. This paper examines the formulation of the convolution method. Model-order reduction techniques are reviewed and benchmark comparisons are performed.
Keywords :
convolution; transfer functions; blackbox macromodeling; blackbox multiport networks; convolution method; macromodel generation scheme; model-order reduction; order reduction technique; passive macromodeling; scattering parameter; transfer function; Approximation methods; Convolution; Frequency domain analysis; Scattering parameters; Time domain analysis; Transfer functions; Transforms; Blackbox; causality; convolution; macromodel; passivity; scattering parameters; vector fitting;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2163308