DocumentCode :
1323062
Title :
A 12-Bit 1.25-GS/s DAC in 90 nm CMOS With  > 70 dB SFDR up to 500 MHz
Author :
Tseng, Wei-Hsin ; Fan, Chi-Wei ; Wu, Jieh-Tsorng
Volume :
46
Issue :
12
fYear :
2011
Firstpage :
2845
Lastpage :
2856
Abstract :
A current-steering digital-to-analog converter (DAC) was fabricated using a 90 nm CMOS technology. Its dynamic performance is enhanced by adopting a digital random return-to-zero (DRRZ) operation and a compact current cell design. The DRRZ also facilitates a current-cell background calibration technique that ensures the DAC static linearity. The measured differential nonlinearity (DNL) is 0.5 LSB and the integral nonlinearity (INL) is 1.2 LSB. At 1.25 GS/s sampling rate, the DAC achieves a spurious-free dynamic range (SFDR) better than 70 dB up to 500 MHz input frequency. The DAC occupies an active area of 1100 750 . It consumes a total of 128 mW from a 1.2 V and a 2.5 V supply.
Keywords :
CMOS integrated circuits; calibration; digital-analogue conversion; CMOS technology; DAC; DAC static linearity; DRRZ; compact current cell design; current-cell background calibration technique; current-steering digital-to-analog converter; differential nonlinearity; digital random return-to-zero; integral nonlinearity; power 128 mW; size 90 nm; spurious-free dynamic range; voltage 1.2 V; voltage 2.5 V; word length 12 bit; CMOS integrated circuits; Calibration; Computer architecture; Microprocessors; Switches; Transient analysis; Background calibration; D/A converters; current-steering; digital random return-to-zero (DRRZ); digital-analog conversion; digital-to-analog converter (DAC); return-to-zero (RZ);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2164302
Filename :
6021346
Link To Document :
بازگشت